Agilent Technologies Blood Glucose Meter AN 372 1 User Manual

Agilent AN 372-1  
Power Supply Testing  
Application Note  
An electronic load offers a broad range of  
operating modes, providing versatile loading  
configurations needed for characterizing and  
verifying DC power supply design specifications.  
 
An Overview of Power Supply Testing Needs  
Power supplies are used in a wide variety of prod-  
ucts and test systems. As a result, the tests per-  
formed to determine operating specifications can  
differ from manufacturer to manufacturer, or from  
end user to end user. For instance, the tests per-  
formed in an R&D environment are primarily for  
power supply design verification. These tests  
require high performance test equipment and a  
high degree of manual control for bench use. In  
contrast, power supply testing in production envi-  
ronments primarily focus on overall function based  
on the specifications determined during the prod-  
ucts design phase. Automation is often essential  
due to large volume testing, which requires high  
test throughput and test repeatability. Power sup-  
ply test instruments must then be computer pro-  
grammable. For both test environments, measure-  
ment synchronization is necessary to perform some  
tests properly and to obtain valid data. In addition,  
considerations such as test set reliability, protec-  
tion of the power supply under test, rack space,  
and total cost of ownership may be of equal impor-  
tance to the power supply test set designer. Proper  
selection of testing instrumentation will provide  
the best combination of measurement sophistica-  
tion and test set complexity.  
The tests covered in the following section are con-  
figured with standard instrumentation: electronic  
loads, digital oscilloscopes, digital multimeters,  
true rms voltmeters, wattmeters, and AC power  
sources.  
Electronic loads can facilitate power supply testing  
in several ways. They are typically programmable,  
although most require external DAC programmers.  
This capability enables finer control over loading  
values during testing, and can provide the test set  
operator with valuable status information. These  
loads are often designed with FETs, which provide  
increased reliability over less sophisticated solu-  
tions consisting of relays and resistors. Also, these  
products offer a selection of operating modes:  
constant current (CC), constant voltage (CV), and  
constant resistance (CR). The more sophisticated  
electronic loads provide all three modes in one  
product for optimum testing flexibility. They pro-  
vide a versatile solution for testing both DC voltage  
and current sources. A final advantage is provided  
by loads with readback over the bus. This can elim-  
inate the need for digital multimeters for voltage  
and current measurements in some tests. As men-  
tioned, there are varying degrees of electronic load  
sophistication. The Agilent Electronic Load family  
provides all of the most sophisticated features and  
high level performance in one box.  
Power Supply Testing Instrumentation  
The power supply testing methods and configu-  
rations discussed in this application note are cer-  
tainly not the only means of obtaining the desired  
measurements. However, certain instruments are  
essential to all tests, regardless of the implementa-  
tion. Some commercially available turnkey power  
supply test systems incorporate custom board level  
instrumentation and hand wiring. However, power  
supply test systems based on standard products  
afford greater benefits. These systems are more  
reliable and provide repeatable, high performance  
measurements because of their low noise environ-  
ment. A system which utilizes standard instrumen-  
tation is modular, allows configuration flexibility  
based on performance needs, and is easier to  
upgrade. In addition, the service, replacement, or  
calibration of separate instruments in the system  
can be performed with minimal system down-time.  
Several other instruments are required for power  
supply testing. The performance criteria (accuracy,  
resolution, stability, bandwidth, etc.) vary for each  
test. In general, the measurement capability of the  
instruments should ensure an error no greater than  
10% of the measured specification. Table 2 on the  
next page provides a guideline for instrument per-  
formance levels for each test discussed in this  
application note.  
3
 
Power Supply Tests  
Table 2  
Load Transient  
Recovery Time  
Current Limit  
Characterization  
Efficiency and  
Power Factor  
Load Effect  
PARD  
Start-Up  
Electronic Load trise 15 µs  
1% programming  
accuracy  
1% programming  
accuracy  
1% programming  
accuracy  
1% programming  
accuracy  
1% programming  
accuracy  
Trigger output to  
the oscilloscope  
CC or CR mode  
CR or CC mode  
CC or CR mode  
Low PARD  
CC or CV mode  
CR mode  
Digital  
Oscilloscope  
tsample 100 ns  
N/A  
N/A  
tsample 25 ns  
N/A  
tsample 1 µs  
Record length 1 K  
samples minimum  
DC to 20 MHz  
minimum bandwidth  
Record length  
2 K samples  
100 µ/Div (linears)  
1 mV/Div (switchers)  
Digital  
Multimeter  
N/A  
N/A  
51/  
0.005% accuracy  
2
Digits  
51/  
0.005% accuracy  
2
Digits  
N/A  
N/A  
N/A  
N/A  
Wattmeter  
N/A  
N/A  
N/A  
1% accuracy with  
crest factors to  
10:1 in current  
waveforms  
Regulated  
AC Source  
>1% regulation  
Adjustable peak  
and frequency  
>1% regulation  
Adjustable peak  
and frequency  
N/A  
N/A  
>1% regulation  
Adjustable peak  
and frequency  
>1% regulation  
Adjustable peak  
and frequency  
Power factor  
measurement  
capability  
>1% regulation  
Adjustable peak  
and frequency  
Phase control  
RF rms  
Voltmeter  
N/A  
N/A  
100 µV Full scale  
DC to 20 MHz  
N/A  
N/A  
minimum bandwidth  
Load Transient Recovery Time  
A constant voltage DC power supply is designed  
with a feedback loop which continuously acts to  
maintain the output voltage at a steady-state level.  
The feedback loop has a finite bandwidth, which  
limits the ability of the power supply to respond  
to a change in the load current. If the time delay  
between the power supply feedback loop input and  
output approaches a critical value at its unity gain  
crossover, the power supply will become unstable  
and oscillate. Typically, this time delay is measured  
as an angular difference and is expressed as a degree  
of phase shift. The critical value is 180 degrees of  
phase shift between the loop input and output.  
Figure 1. Load Transient Recovery Time  
Load transient recovery time measurements require an electronic  
load with a risetime and falltime at least five times faster than the  
power supply under test.  
4
 
For a step change in load current, a marginally  
stable CV power supply will have a ringing voltage  
output. This defeats the purpose of the power sup-  
ply’s regulation circuitry and can be damaging  
to voltage-sensitive loads. An example of a voltage-  
sensitive load is the logic circuitry in a computer.  
In this case, a computer manufacturer that pur-  
chases power supplies from an external source may  
consider verifying the load transient recovery spec-  
ification of the power supply subassembly. This  
test can also reveal critical manufacturing flaws  
that can cause instability, such as a defective out-  
put filter capacitor or loose capacitor connections.  
used in this test should have a risetime at least  
five times faster than the power supply under test,  
and should be able to operate in CC mode (or CR  
mode) up to the maximum current rating of the  
power supply. Measuring the load transient recov-  
ery time requires the load to have the capability  
to pulse between two different values in CC or CR  
mode. For continuous load transient testing, the  
repetition rate of the pulses should be slow enough  
so that the power supply feedback loop can recover  
and stabilize after each applied transient.  
Figure 2 shows a typical test system for making load  
transient recovery time measurements. Measure-  
ment of Vout of the power supply can be made with  
a digitizing oscilloscope as the load input pulses  
are applied. Synchronization of the measurement  
is crucial in obtaining proper measurements. There-  
fore, a common trigger should start the electronic  
load and oscilloscope measurements.  
Test Overview/Procedures  
CV Load Transient Recovery Time is a dynamic  
measurement of the time required for the output  
voltage of a CV power supply to settle within a  
predefined settling band following a load current  
induced transient (see Figure 1). The response is  
typically measured in microseconds or milliseconds,  
and varies in value depending on the topology of  
the power supply under test. The electronic load  
Figure 2. Load Transient Recovery Test Configuration and VOUT Measurement Results for a CV Power Supply  
5
 
For multiple output CV power supplies, cross  
load effect is determined. This is an extension of  
the load effect test for a single output power sup-  
ply, and determines the ability of all outputs of a  
CV power supply to remain within their specified  
voltage rating for a load current change on one  
output. Conversely, the ability of one output to  
withstand the effects of changes on all other out-  
puts can be specified.  
Load Effect (Load Regulation)  
Load Effect or Load Regulation is a static perform-  
ance measurement which defines the ability of a  
power supply under test to remain within specified  
output limits for a predetermined load change (see  
Figure 3). In a CV power supply, the influenced  
quantity of interest is the steady-state output cur-  
rent. In a CC power supply, the influenced quantity  
is the steady-state output voltage. For single output  
CV power supplies, voltage load effect is given for a  
load current change equal to the current rating of  
the supply. A typical specification would be stated  
in millivolts, or as a % of the rated output voltage.  
Test Overview/ Procedures  
For a CV power supply, measurement of the output  
voltage and input voltage should be made after the  
load is varied from the minimum to the full current  
rating of the power supply under test (Figure 4).  
Measurement of the AC input voltage is necessary  
to ensure that the output voltage change is a result  
of only the load change, and not from a change in  
the AC input. To decrease the test time when test  
throughput is a concern, a regulated AC source  
providing a predetermined AC input level and fre-  
quency can be utilized. This will eliminate the need  
for the AC input voltage measurement.  
The output voltage should be allowed the specified  
settling time before measurements are taken. An  
electronic load selected for this test must be capa-  
ble of operating in CC or CR mode, and must have  
input ratings (voltage, current, and power) suffi-  
cient to accommodate the maximum ratings of the  
power supply under test.  
Figure 3. Load Effect  
For a load current change equal to the full current rating of a CV  
power supply, the resulting change in VOUT should not exceed the  
predetermined load effect band. Typical specifications for load  
effect range from 0.005 to 0.5% of the maximum output voltage.  
Figure 4. Load Effect Testing Configuration  
A regulated AC source is used in this load effect testing configuration to maintain the AC input at a predetermined  
value. This will ensure that the test results reflect changes in VOUT only with respect to load current changes.  
6
 
Test Overview/ Procedures  
Current Limit Characterization  
A measurement of the output voltage and current  
of the power supply under test is required while  
decrementing the electronic load resistance (or  
current in CC mode) by steps from an initial value  
that produces the power supply’s full rated voltage  
output (see Figure 6). The voltage will remain con-  
stant until the compliance current (output current  
of the power supply) increases to the preset current  
limit value. The crossover region or current limit  
has been reached when the rated output voltage of  
the power supply changes by a degree greater than  
the load regulation specification. At the current  
limit knee, the compliance current and output volt-  
age behavior is determined by the type of current  
limiting circuit implemented in the power supply  
design (see Table 3).  
Current limit measurements demonstrate the degree  
to which a constant voltage power supply limits its  
maximum output current to a preset value. This  
preset value can be fixed or variable throughout a  
specified range. There are basically three types of  
current limiting design implementations:  
1. Conventional current limiting power supplies  
2. CV/CC mode power supplies  
3. Foldback current limiting power supplies  
Conventional current limiting power supplies  
and CV/CC mode power supplies are very similar  
in function. These implementations generally vary  
only in the degree of regulation in the constant  
current operating region (see Figure 5) and in the  
ability of the user to adjust the CC operating point  
(CV/CC power supplies). A rounded crossover knee  
and sloping current limit characteristic denotes  
less precise current regulation. In comparison, a  
sharp knee and vertical current limit characteristic  
denote a higher degree of current regulation. The  
foldback current limiting power supply employs a  
technique that enables both the output voltage and  
current to decrease simultaneously for load resist-  
ances below the crossover value. The purpose of  
current limiting is to provide protection for the  
power supply and the device being powered (assum-  
ing the current limit value is below the maximum  
current rating of the device).  
Table 3. Typical Test Results of Standard Current  
Limiting Implementations  
I Compliance (or Iout  
)
Current Limiting Method  
CV/CC  
at Minimum Load Resistance  
Remain constant (CC mode)  
Conventional Current Limiting Typically (105%) Imax  
Current Foldback Typically foldback is (50%) Imax  
Figure 5. Typical Operating Characteristics of Three Types of Current  
Limiting Power Supplies  
7
 
some applications, a low output ripple specifica-  
tion is critical. An example would be where the  
power supply is providing power to a high gain  
amplifier with inadequate ripple rejection for the  
application. In this case, a portion of the power  
supply PARD would be amplified along with the  
desired signal. It is extremely important that the  
PARD value be specified as a peak-to-peak value  
as well as an rms value in this application. The  
peak-to-peak value would provide information on  
high magnitude, short duration noise spikes while  
the rms value would be beneficial for determina-  
tion of the expected signal-to-noise ratio.  
PARD (Periodic and Random Deviation)  
PARD (formerly known as ripple and noise) is the  
periodic and random deviation of the DC output  
voltage from its average value, over a specified  
bandwidth, and with all other parameters con-  
stant. It is representative of all undesirable AC and  
noise components that remain in the DC output  
voltage after the regulation and filtering circuitry  
(see Figure 7).  
PARD is measured in rms or peak-to-peak values,  
and is typically specified over a bandwidth range  
of 20 Hz to 20 MHz. Any deviation below 20 Hz is  
included in a specification called output drift. In  
Figure 6. Test Configuration and Results for Current Limit Characterization  
Figure 7. PARD Consists of Undesirable Signals Superimposed on the DC Output of  
a Power Supply  
8
 
The first set of PARD measurements should be  
made with the AC source voltage and frequency  
set at the lowest specified values, and with the  
power supply under test at its minimum and then  
maximum rated load value. A second set of meas-  
urements should be made with the AC source set  
at the highest specified values of amplitude and  
frequency, and with the power supply minimally  
loaded and then maximally loaded. To test multiple  
output power supplies, PARD measurements for  
each output should be made with all other outputs  
set initially to minimum load, and then to maxi-  
mum load.  
Test Overview/Procedures  
To make PARD measurements, the electronic load  
used should operate in CR mode for constant volt-  
age and constant current power supplies. The load  
should also have lower PARD than the power sup-  
ply being tested. This is especially important when  
measuring the PARD of linear power supplies, since  
they typically have excellent PARD specifications.  
A regulated AC source should be applied to the  
input of the power supply under test. PARD meas-  
urements are made at the lowest and highest speci-  
fied values of AC input to the power supply, and at  
the lowest and highest specified source frequencies.  
Proper connections between the instruments and  
power supply under test are essential when making  
these measurements. Since PARD consists of low  
level, broadband signals, major test set concerns  
are ground loops, proper shielding, and impedance  
matching. A digitizing oscilloscope can be used for  
peak-to-peak measurements (see Figure 8). High  
frequency noise spikes need to be measured, and  
therefore the digitizing rate of the oscilloscope must  
be at least five times the maximum PARD frequen-  
cy for proper sampling. To eliminate cable ringing  
and standing waves, the typical configuration  
includes coaxial cabling with 50 Ohm terminations  
at both ends. Capacitors should be connected in  
series with the signal path to block the DC current.  
A true rms RF voltmeter should be used to meas-  
ure the rms specification. Precautions similar to  
those for the peak-to-peak measurements should  
be considered. For both measurements, care should  
be taken to prevent ground loops. Since most  
oscilloscopes and true rms voltmeters have ground  
referenced inputs, testing a power supply with  
grounded outputs may create such a ground loop.  
In this case, it may be necessary to use instru-  
ments with floating (differential amplifier) inputs  
to eliminate this problem.  
Figure 8. PARD Testing Configuration  
9
 
Efficiency  
Start-Up  
The efficiency of a power supply is simply the  
ratio of its total output power to its total input  
power. To obtain the true input power (rms voltage  
x in-phase rms current) of a typical AC-to-DC  
converting power supply, commercially available  
wattmeters or AC sources can be used to measure  
the necessary parameters. The instrument used  
to measure the input current and voltage must be  
capable of sampling the input signals at a rate  
fast enough to produce accurate measurements.  
The start-up delay of a power supply is the amount  
of time between the application of AC input and  
the time at which the outputs are within their reg-  
ulation specification. For switching power supplies  
or power supplies with current limiting, this time  
period is essential for proper sequencing of the out-  
put voltage at turn-on. In switching power supply  
designs, undesirable events can occur at turn-on,  
causing current spikes which can destroy the switch-  
ing transistors. The problem occurs when the feed-  
back loop tries to compensate for the low output  
voltage that it sees when the AC input is initially  
applied to the power supply. This problem is usually  
solved by adding “soft-start” circuitry to limit the  
time the switching transistors are turned on during  
the start-up sequence. This will limit the current  
flow through them until the power supply has  
reached stable operation.  
This test serves as a good indication of the overall  
correct operation of the power supply under test.  
If the measured efficiency is outside the specified  
range for the topology of the power supply, it is  
probable that a design flaw or a manufacturing  
problem exists that should be addressed.  
Test Overview/Procedures  
The efficiency and power factor of the power supply  
under test should be measured under steady-state  
operation after the unit has been allowed to warm  
up. The electronic load can be operated in CC mode  
(for CV power supplies) and CV mode for (CC power  
supplies). At least two load settings should be used,  
one of them being the maximum rated load for the  
power supply under test (see Figure 9 for test con-  
figuration). Some power supplies vary substantially  
in efficiency and power factor as a function of load-  
ing. In this case, the load should be varied through  
enough settings so that curves can be plotted from  
the data to provide the best representation of the  
test results.  
Another undesirable condition that can occur  
during power supply start-up is voltage latch-up.  
In this case, the output voltage of a CV power sup-  
ply with current foldback fails to reach its full  
value at turn-on because the output current attempts  
to immediately go to a high value. The protective  
response of the current foldback circuitry of the  
power supply can cause the output voltage to “latch-  
up” at a point where the current that must be dis-  
sipated can cause damage to the power supply (see  
Figure 10). It is, therefore, beneficial to measure  
the start-up delay time and fully characterize it to  
ensure safe operation at turn-on.  
Figure 9. Configuration for Testing Efficiency and Power Factor  
In this test configuration for measuring power supply efficiency and power factor, the variable AC source  
provides measurements for input power and power factor.  
10  
 
To fully characterize the start-up sequence of the  
power supply under test, measurements must be  
made of the output voltage response to the instan-  
taneous application of the AC input (see Figure 11).  
A digital oscilloscope should be used so that stor-  
age of the output values can be accomplished for  
the measured start-up time period. To accurately  
control the AC input frequency and amplitude to  
the power supply under test, a regulated AC source  
should be used. Turn-on of the AC source at selected  
60 Hz (50 Hz) phases (zero-crossing and positive or  
negative peak voltage, for example) is important for  
thorough characterization of start-up. The electronic  
load used in this test should operate in CR mode.  
Figure 10. Voltage Latch-Up  
Undesirable voltage latch-up and turn-on can cause the power supply to operate at  
current levels that may be damaging to internal circuitry.  
Figure 11. Start-Up Delay Test Configurations and Results  
11  
 
Other Power Supply Tests  
An observation of any DC power supply data sheet  
from a power supply manufacturer reveals a number  
of design specifications that must be verified and  
tested. These tests often differ in technique and in  
the test equipment that is used to measure the var-  
ious parameters. The common aspect of all of these  
tests is that a method of controlled loading of the  
power supply outputs is required, which is most  
easily done with an electronic load. The list below  
contains a brief description of some of these tests.  
Short Circuit Output Current  
This test measures the steady-state current of the  
power supply under test after the output terminals  
have been shorted. The short circuit can be provided  
by an electronic load operating in CR mode.  
Test Equipment:  
• Electronic Load  
• Digital Multimeter  
• Precision Current Shunt  
Drift  
Overvoltage Shutdown  
This test involves the measurement of the periodic  
and random deviation of a power supply’s output  
current or voltage (typically over 8 hours), typically  
covering a bandwidth from DC to 20 Hz. The elec-  
tronic load used for this test should be able to oper-  
ate in CC or CV mode.  
Typically, a power supply is expected to shut down  
if its output voltage exceeds the maximum input  
voltage of its intended load, the maximum operating  
voltage of the power supply, or a variably set volt-  
age limit. The overvoltage protection test demon-  
strates the ability of the power supply under test  
to correctly respond to any of those conditions. An  
electronic load in CC mode can be used to test the  
output voltage response.  
Test Equipment:  
• Computer (for long-term testing)  
• Electronic Load  
• True rms Voltmeter  
Test Equipment:  
• Electronic Load  
• Digital Multimeter  
Source Effect (Line Regulation)  
A measurement of the change in the output voltage  
or current due to a change in the source voltage  
magnitude. The output of interest is measured  
after it settles within the regulation specifications.  
The electronic load used for this test should be  
able to operate in CC or CV mode.  
Programming Response Time  
This test measures the maximum time required  
for the programmed output voltage or current of  
a power supply to change from a specified initial  
value to a value within a specified tolerance band  
of a newly programmed value, following the onset  
of a step change in an analog programming signal,  
or the gating of a digital signal. An electronic load  
in CC, CR, or CV could be used in this test.  
Test Equipment:  
• Electronic Load  
• Regulated AC Source  
• Digital Multimeter  
• Precision Current Shunt  
Test Equipment:  
• Computer  
• Electronic Load  
• Digital Multimeter  
• Precision Current Shunt  
12  
 
Power Supply Testing with Agilent Electronic Loads  
The Agilent Electronic Load Family offers the power  
supply tester the solution for many of the tests that  
must be performed. For bench or system applica-  
tions in large or small scale testing environments,  
Agilent Electronic Loads provide high quality and  
reliability with superior performance, features, and  
documentation. This will make power supply test  
system configuration easier, measurement proce-  
dures repeatable, and operating environments safer.  
For testing multiple output power supplies, Agilent  
offers the 6050A 1800 Watt Load Mainframe. This  
product provides an economical alternative to the  
6060A and 6063A for large scale testing environ-  
ments. It has six slots which can be user-configured  
up to 1800 Watts with the Agilent Electronic Load  
Modules—the 60501A 150 Watt Module, the 60502A  
300 Watt Module, the 60503A 240 Volt Module, and  
the 60504A 600 Watt Module. The 6050A provides  
all of the features of the 6060A and 6063A.  
The Agilent 6060A 300 Watt and 6063A 240 V Single  
Input DC Electronic Load provide many features  
that are fully programmable in CC, CV, or CR mode.  
For measurements that require step load changes,  
the 6060A and 6063A contain a transient generator  
that has a minimum risetime of 12 microseconds.  
This allows for load transient response testing of  
high performance linear (series regulated) power  
supplies as well as switching power supplies. In  
addition, the duty cycle and frequency of the tran-  
sient generator can be fully controlled using the  
front panel, or via programming through the built-  
in GPIB.  
The Electronic Load Family provides “One Box”  
solutions for system applications. These loads con-  
tain a DMM and precision current shunt for voltage,  
current, and power readback via the built-in GPIB.  
In addition, Agilent Electronic Loads contain a  
transient generator, provide status readback, and  
have voltage and current programmers that reside  
in the box. This eliminates the need for external  
DMMs in many power supply test applications, and  
therefore saves rack space and additional test  
system costs.  
For reliable and safe operation, Agilent Electronic  
Loads offer full protection against overvoltage, over-  
current, overpower, overtemperature, and reverse  
polarity conditions. The reliability of Agilent Elec-  
tronic Loads are backed by a standard three year  
warranty. The reliability, performance, and features  
of the 6060A, 6050A, 60501A, 60502A, 60503A, and  
60504A, combined with competitive prices, make  
these products an optimum solution for power  
supply testing applications.  
Synchronizing the measuring instruments in a  
power supply test system is essential to retrieve  
valid test data. The 6060A and 6063A can generate  
triggers that can externally trigger a DMM, digital  
oscilloscope, or wattmeter to take a measurement  
as the load changes according to the testing goals.  
The 6060A and 6063A can also change in response  
to external triggers from other test equipment.  
13  
 
By internet, phone, or fax, get assistance with all your  
test and measurement needs.  
Online Assistance  
Phone or Fax  
United States:  
(tel) 1 800 452 4844  
Canada:  
(tel) 1 877 894 4414  
(fax) (905) 282 6495  
Europe:  
(tel) (31 20) 547 2323  
(fax) (31 20) 547 2390  
Japan:  
(tel) (81) 426 56 7832  
(fax) (81) 426 56 7840  
Latin America:  
(tel) (305) 269 7500  
(fax) (305) 269 7599  
Australia:  
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New Zealand:  
(tel) 0 800 738 378  
(fax) (64 4) 495 8950  
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(tel) (852) 3197 7777  
(fax) (852) 2506 9284  
Product specifications and descriptions in this  
document subject to change without notice.  
Copyright © 1988, 2000 Agilent Technologies  
Printed in U.S.A. 10/00  
5952-4190  
 

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